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Список публікацій:
- Combined Multiparametric X-Ray Diffraction Diagnostics of Microdefects in Silicon Crystals after Irradiation by High-Energy Electrons
E.N. Kislovskii, V.B. Molodkin, S.I. Olikhovskii, E.G. Len, B.V. Sheludchenko, S.V. Lizunova, T.P. Vladimirova, E.V. Kochelab, O.V. Reshetnyk, V.V. Dovganyuk, I.M. Fodchuk, T.V. Lytvynchuk, and V.P. Kladko // Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, 2013, 7, No3, P.523-530.Download: [pdf]
