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Department's structure
The department is the part of
"Division for Structural and Elemental Analysis of Semiconductor Materials and Systems"
Head of Division: Corresponding Member NAS of Ukraine, Prof., Dr. Sci. (Phys. - Math.) Kladko Vasyl Petrovych

Department's head:
Corresponding Member NAS of Ukraine, Prof., Dr. Sci. (Phys. - Math.) Kladko Vasyl Petrovych


High-resolution x-ray diffraction and computer simulations of the diffraction processes:
Prof., Dr. Sci. (Phys. - Math.) Kladko Vasyl Petrovych
Ph. D. (Phys. - Math.), research assistent - Slobodian Mykola Vasylyovych
Ph. D. (Phys. - Math.), research assistant -  Stanchu Grigoriy Viktorovich

High-resolution x-ray diffractometry of nanosystems:
Ph. D. (Phys. - Math.), research assistant - Gudymenko Oleksandr Yosypovych
Ph. D. (Phys. - Math.), research assistant - Stanchu Grigoriy Viktorovich
Ph. D. (Phys. - Math.), research assistant - Kryvyi Serhii Borysovich

X-ray structural analysis of semiconductors and heterosystems:
Ph. D. (Phys. - Math.), senior research assistant - Kuchuk Andrian Volodymyrovych
Ph. D. (Phys. - Math.), senior research assistant  - Safryuk Nadiya Volodymyrivna
research assistant, Maksimenko Zoya Vasylivna
junior research assistant,  Polischhuk Yulya Olegivna

Molecular-beam epitaxy:
Ph. D. (Phys. - Math.), senior research assistant - Stadnyk Oleksandr Anatoliyovych

Department's manager:
chief engineer - Proskurenko Natalya Mykolayivna







 
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