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- X-ray analysis for micro-structure of AlN/GaN multiple quantum well systems
Oleksii I. Liubchenko, Vasyl P. Kladko, Tomash M. Sabov, Oleksandr V. Dubikovskyi // Journal of Materials Science: Materials in Electronics, 2019, V.30, Issue 1, P.499-507. - Особенности температурной зависимости удельного контактного сопротивления диффузионных кремниевых структур Au-Ti-Pd-n+-n-Si
А.Е. Беляев, Н.С. Болтовец, В.П. Кладько, Н.В. Сафрюк-Романенко, A.И. Любченко, В.М. Шеремет, В.В. Шинкаренко, А.С. Слепова, В.А. Пилипенко, Т.В. Петлицкая, А.С. Пилипчук, Р.В. Конакова, А.В. Саченко // Физика и техника полупроводников, 2019, V.53, вып.4, С.485-492.Download: [pdf] - Photoluminescence, conductivity and structural study of terbium doped ZnO films grown on different substrates
N. Korsunska, L. Borkovska, Yu. Polischuk, O. Kolomys, P. Lytvyn, I. Markevich, V. Strelchuk, V. Kladko, O. Melnichuk, L. Melnichuk, L. Khomenkova, C. Guillaume, X. Portier // Materials Science in Semiconductor Processing, 2019, V.94, P.51-56. - Structure, Non-stoichiometry, Valence of Ions, Dielectric and Magnetic Properties of Single-Phase Bi0.9La0.1FeO3-δ Multiferroics
A.V Pashchenko,N.A Liedienov, Quanjun Li, D.D. Tatarchuk, V.A. Turchenko, I.I. Makoed, V.Ya. Sycheva, A.V. Voznyak, V.P. Kladko, A.I. Gudimenko, Y.V. Didenko, A.T. Kozakov, G.G. Levchenko // Journal of Magnetism and Magnetic Materials, 2019, V.483, P.100-113. - Features of the Temperature Dependence of the Specific Contact Resistance of Au–Ti–Pd–n+–n-Si Diffusion Silicon Structures
A.E. Belyaev, N.S. Boltovets, V.P. Kladko, N.V. Safryuk-Romanenko, A.I. Lubchenko, V.N. Sheremet, V.V. Shynkarenko, A.S. Slepova, V.A. Pilipenko, T.V. Petlitskaya, A.S. Pilipchuk, R.V. Konakova, A.V. Sachenko // Semiconductors, 2019, V.53, No4, P.469-476.Download: [pdf] - Microscopic mechanisms of Si(111) surface nitridation and energetics of Si3N4/Si(111) interface
T.L. Petrenko, V.P. Bryksa, I.V. Dyka, V.P. Kladko, A.E. Belyaev, A.V. Kuchuk // Applied Surface Science, 2019, V.483, P.302-312. - The effect of ion implantation on structural damage in compositionally graded AlGaN layers
O.I. Liubchenko, V.P. Kladko, H.V. Stanchu, T.M. Sabov, V.P. Melnik, S.B. Kryvyi, A.Y. Belyaev // Semiconductor physics, quantum electronics and optoelectronics, 2019, V.22, No 1, P.119-129.Download: [pdf] - Liquid-phase sintered bismuth ferrite multiferroics and their giant dielectric constant
NA Liedienov, AV Pashchenko, VA Turchenko, V Ya Sycheva, AV Voznyak, VP Kladko, AI Gudimenko, DD Tatarchuk, YV Didenko, IV Fesych, II Makoed, AT Kozakov, GG Levchenko // Ceramics International, 2019, V.45, P.14873-14879. - Grains, grain boundaries and total ionic conductivity of 10Sc1CeSZ and 8YSZ solid electrolytes affected by crystalline structure and dopant content
I. Brodnikovska, N. Korsunska, L. Khomenkova, Yu. Polishchuk, S. Lavoryk, M. Brychevskyi, Y. Brodnikovskyi, O. Vasylyev // Materials Today: Proceedings, 2019, Volume 6, Part 2, P.79-85.Download: [pdf] - Structural properties of Ag-As-S chalcogenide glasses in phase separation region and their application in holographic grating recording
O. Stronski, L. Revutska, A. Meshalkin, O. Paiuk, E. Achimova, A. Korchovyi,K. Shportko, O. Gudymenko, A. Prisacar, A. Gubanova, G. Triduh // Opt. Mater., 2019, V.94, P.393–397.
